UNIST-FEI Atomic Imaging Center led by Prof. Zonghoon Lee is a collaborative electron microscopy center between UNIST, one of the leading research universities in South Korea and FEI Company, a leading electron microscope manufacturer.
The Titan G2 60-300 microscope is being heralded world-wide as the best performing TEM at accelerating voltages suitable for research on carbon-based nano-materials especially when fitted with the unique monochromator. As such and to increase its exposure in the region, FEI Company installed such a system at UNIST Central Research Facility, one of the leading research facilities in South Korea. Moreover the single largest driver in TEM development has always been the feed-back from real-world application needs and the proposed alliance will ensure that the specific needs of the South Korean research community will be taken into account.
This collaborative center pursues the research on the atomic scale imaging for carbon-based nano-materials and exploring various advanced materials. We strive to study the microstructures of materials and related properties in the field of materials science at atomic scale.